Next-generation high resolution magnetic field imaging

- Next-generation high resolution magnetic field imaging -

Development of Focus 002

When we adopt a thin film magnetic field sensor, the spatial resolution is strongly dependent on the fast scan direction. We have developed a novel reconstruction software capable of solving maxwell-equation with the integral geometric mathematical procedure. By using this reconstruction software, the spatial resolution can be improved toward few nanometer.

Atomic Force Microscope

Studying easy-to-use of high-peformance Atomic Force Microscope

The feedback regulation of tip-sample distance in AFM imaging makes it harder to use than electron microscopes. We study the technology of a feedback-free imaging system and reduce the burden of determination of feedback parameters which is strongly dependent on the situation of sample surface.